Submitted to: Analytical Chemistry
Publication Type: Abstract Only
Publication Acceptance Date: May 8, 1995
Publication Date: N/A
Technical Abstract: Complete knowledge of the fate and behavior of pesticides is critical to improving the quality of nursery, landscape, turf and food-use crops while reducing production costs and negative impacts to the environment. Usage of conventional pesticides continues, in lieu of safer, biological pesticides not yet available. Direct morphological and chemical evaluation of foliar fungicide residue is possible using electron beam analysis(EBA), a combination of scanning electron microscopy, energy dispersive x-ray analysis and digital beam control. Cu(OH)2 fungicide spray, applied onto either unprepared leaf or inert sampling surfaces and sputtered-coated with carbon were examined using EBA. Residue coverage per unit area was directly quantified via secondary electron images, elemental spectra and x-ray distribution maps. Coverage assessment is critical in efforts to improve spray methodology and efficacy and, ultimately, integrated pest management.