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United States Department of Agriculture

Agricultural Research Service

Research Project: PRESERVATION, ENHANCEMENT, AND MEASUREMENT OF GRAIN QUALITY AND MARKETABILITY

Location: Stored Product Insect and Engineering Research

Title: Single-kernel NIR analysis for evaluating wheat samples for fusarium head blight resistance

Authors
item Peiris, K.H.S. -
item Dong, Y -
item Bockus, W -
item Dowell, Floyd

Submitted to: Cereal Chemistry
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: August 6, 2013
Publication Date: January 1, 2014
Repository URL: http://dx.doi.org/10.1094/CCHEM-11-12-0157-R
Citation: Peiris, K., Dong, Y., Bockus, W.W., Dowell, F.E. 2014. Single-kernel NIR analysis for evaluating wheat samples for fusarium head blight resistance. Cereal Chemistry. 91(1):35-40.

Interpretive Summary: Fusarium head blight (FHB) of wheat is a destructive disease caused by several Fusarium species. Besides significant grain yield and quality losses, mycotoxins such as deoxynivalenol (DON) produced by the Fusarium fungi are a serious problem affecting grain marketability and food and feed safety. Wheat breeding programs need a method to rapidly evaluate numerous wheat lines for FHB resistance. We developed a method to estimate bulk DON content of wheat grain samples using single kernel DON levels estimated by a single kernel near infrared (SKNIR) system combined with single kernel weights. This method estimated bulk DON levels in 90% of 160 grain samples within 6.7 ppm DON. Distribution of single kernel DON levels among kernels in grain samples was used to compare FHB reaction of wheat varieties grown under FHB disease pressure with or without fungicide application. Study of the distribution of DON levels among all kernels as well as among DON containing kernels in a grain sample is helpful for an in-depth evaluation of the effect of varieties or fungicides on FHB reaction. The SKNIR single kernel DON analysis and study of single kernel DON distribution patterns demonstrated in this study may be helpful for wheat breeders for evaluation of the FHB resistance of varieties in relation to their resistance to spread of disease and resistance to DON accumulation.

Technical Abstract: A method to estimate bulk deoxynivalenol (DON) content of wheat grain samples using single kernel DON levels estimated by a single kernel near infrared (SKNIR) system combined with single kernel weights is described. This method estimated bulk DON levels in 90% of 160 grain samples within 6.7 ppm DON when compared to DON determined by the gas chromatography-mass spectrometry method. Single kernel DON analysis showed that DON content among DON containing kernels (DCK) varied considerably. Distribution of single kernel DON levels among kernels in grain samples was used to compare Fusarium head blight (FHB) reaction of wheat varieties grown under FHB disease pressure with or without fungicide application. Single kernel DON analysis allowed examination of the distribution of DON levels among kernels in grain samples. Study of the distribution of DON levels among all kernels as well as among DCK of a grain sample is helpful for an in-depth evaluation of the effect of varieties or fungicides on FHB reaction. The SKNIR single kernel DON analysis and study of single kernel DON distribution patterns demonstrated in this study may be helpful for wheat breeders for evaluation of the FHB resistance of varieties in relation to their resistance to spread of disease and resistance to DON accumulation.

Last Modified: 12/21/2014
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