Title: Development and application of multispectral algorithms for defect apple inspection Authors
Submitted to: ASABE Annual International Meeting
Publication Type: Proceedings
Publication Acceptance Date: July 29, 2012
Publication Date: August 1, 2012
Citation: Yang, C., Kim, M.S., Chao, K. 2012. Development and application of multispectral algorithms for defect apple inspection. ASABE Annual International Meeting. Paper #12133701. Technical Abstract: This research developed and evaluated the multispectral algorithm derived from hyperspectral line-scan imaging system which equipped with an electron-multiplying-charge-coupled-device camera and an imaging spectrograph for the detection of defect Red Delicious apples. The algorithm utilized the fluorescence intensities at three wavebands, 676 nm, 714 nm and 779 nm, for computation of a simple threshold function for effective detection of defect apples. The algorithm detected more than 95% of defect apples. The results showed that a simple multispectral detection algorithm can be used for implementation on fast-speed apple processing lines.