Technical Abstract: Stripe rust of wheat, caused by Puccinia striiformis f. sp. tritici, continues causing severe damage worldwide. Durable resistance is a key for sustainable control of the disease. High-temperature adult-plant (HTAP) resistance, which expresses when weather becomes warm and plants grow old, has been demonstrated to be durable. We have conducted a series of studies for understanding molecular mechanisms of different types of stripe rust resistance using a transcriptomics approach. Through comparing gene expression patterns with race-specific, all-stage resistance controlled by various genes, we have found that more diverse genes are involved in HTAP resistance. The genes involved in HTAP resistance are induced more slowly and their expression induction is less dramatic than genes involved in all-stage resistance. The high diversity of genes and less dramatic expression induction may explain the durability and incomplete level of HTAP resistance. Identification of transcripts may be helpful in identifying resistance controlled by different genes and selecting better combinations of genes for pyramiding to achieve more durable and high level resistance.