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Title: Registration of ‘Xerpha’ Wheat

Author
item JONES, S - Washington State University
item LYONS, S - Washington State University
item BALOW, K - Washington State University
item GOLLNICK, M - Washington State University
item MURPHY, K - Washington State University
item KUEHNER, J - Washington State University
item MURRAY, T - Washington State University
item Chen, Xianming
item Engle, Douglas
item Garland-Campbell, Kimberly

Submitted to: Journal of Plant Registrations
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 1/4/2010
Publication Date: 5/1/2010
Citation: Jones, S.S., Lyons, S.R., Balow, K.A., Gollnick, M.A., Murphy, K.M., Kuehner, J.S., Murray, T.D., Chen, X., Engle, D.A., Garland Campbell, K.A. 2010. Registration of ‘Xerpha’ Wheat. Journal of Plant Registrations 4:137-140.

Interpretive Summary: Many of the current soft white winter (SWW) wheat cultivars produced in Washington are adapted to specific environments. The objective of this research was to develop a high yielding, disease resistant SWW cultivar with competitive yield potential for all Washington winter wheat production environments. ‘Xerpha’ (PI 645605) SWW wheat was developed by the Agricultural Research Center of Washington State University (WSU) and released in 2008. It was selected from an ‘Eltan’/‘Estica’ cross made in 1999 and advanced to the F5 in the greenhouse by a modified single seed descent breeding strategy. Successive progeny were advanced under fi eld conditions by a modified pedigree-bulk breeding method. Xerpha was the highest, or among the highest, yielding SWW cultivars in every precipitation zone in the WSU Extension Uniform Cereal Variety Testing Program trials in 2006, 2007, and 2008. It was released as a replacement for ‘Madsen’ and Eltan on the basis of its superior grain yield in Washington’s low [<400 mm average annual precipitation (AAP)], intermediate (400–500 mm AAP), and high (> 500 mm AAP) precipitation zones; excellent grain volume weight; strong cold tolerance, and high-temperature, adult-plant resistance to stripe rust.

Technical Abstract: Many of the current soft white winter (SWW) wheat (Triticum aestivum L.) cultivars produced in Washington are adapted to specific environments. The objective of this research was to develop a high yielding, disease resistant SWW cultivar with competitive yield potential for all Washington winter wheat production environments. ‘Xerpha’ (Reg. No. CV-1045, PI 645605) SWW wheat was developed by the Agricultural Research Center of Washington State University (WSU) and released in 2008. It was selected from an ‘Eltan’/‘Estica’ cross made in 1999 and advanced to the F5 in the greenhouse by a modified single seed descent breeding strategy. Successive progeny were advanced under field conditions by a modified pedigree-bulk breeding method under the experimental designations SSD01061 and eventually WA007973. Xerpha was the highest, or among the highest, yielding SWW cultivars in every precipitation zone in the WSU Extension Uniform Cereal Variety Testing Program (EUCVTP) trials in 2006, 2007, and 2008. It was released as a replacement for ‘Madsen’ and Eltan on the basis of its superior grain yield in Washington’s low [<400 mm average annual precipitation (AAP)], intermediate (400–500 mm AAP), and high (> 500 mm AAP) precipitation zones; excellent grain volume weight; strong cold tolerance, and high-temperature, adult-plant (HTAP) resistance to stripe rust (caused by Puccinia striiformis Westend. f. sp. tritici).