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ARS Home » Midwest Area » Urbana, Illinois » Soybean/maize Germplasm, Pathology, and Genetics Research » Research » Publications at this Location » Publication #254919

Title: Registration of three soybean germplasm lines resistant to Phakopsora pachyrhizi (soybean rust)

Author
item PAUL, C - University Of Illinois
item Bowen, Charles
item TEFERA, H - International Institute For Tropical Agriculture
item BANDYOPADHYAY, R - International Institute For Tropical Agriculture
item SIKORA, E - University Of Auburn
item PEGUES, M - University Of Auburn
item Hartman, Glen

Submitted to: Journal of Plant Registrations
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 5/21/2010
Publication Date: 12/1/2010
Citation: Paul, C., Bowen, C.R., Tefera, H., Bandyopadhyay, R., Sikora, E., Pegues, M.D., Hartman, G.L. 2010. Registration of three soybean germplasm lines resistant to Phakopsora pachyrhizi (soybean rust). Journal of Plant Registrations. 4:244-248.

Interpretive Summary: Soybean rust, caused by the fungus Phakopsora pachyrhizi, can cause severe yield losses under conducive environmental conditions. Resistance to soybean rust is the most economical means to manage this disease. Three soybean lines with resistance to soybean rust and to bacterial pustule were selected from lines developed by the International Institute of Tropical Agriculture (IITA) through a collaborative U.S.-A.I.D. linkage grant with IITA. These lines were derived from a tropical soybean rust resistant cultivar ‘UG5’ and a rust susceptible highyielding elite breeding line, TGx 1805-31F. These three lines, because of their later maturity, will be more adaptable to the southern U.S. This information will be used by private and public soybean pathologists and breeders that work on soybean rust resistance.

Technical Abstract: Soybean rust, caused by Phakopsora pachyrhizi Sydow, is one of the most important foliar diseases of soybean [Glycine max (L.)Merr.]. Development of rust resistant lines is one objective of many soybean breeding programs. Three soybean germplasm lines esignated as TGx 1987-76F (Reg. No. xxx, PI 657702), TGx 1987-118F (Reg. No. xxx, PI 657703), and TGx 1987-129F (Reg. No. xxx, PI 657701) with resistance to P. pachyrhizi and to Xanthomonas axonopodis pv. glycines (Nakano) Vauterin, Hoste, Kersters & Swings (bacterial pustule) were selected from lines developed by the International Institute of Tropical Agriculture (IITA) through a collaborative USAID linkage grant to IITA and the USDA Agricultural Research Service at the University of Illinois. These lines were derived from a tropical soybean rust resistant cultivar UG5, and a rust susceptible high-yielding elite breeding line, TGx 1805-31F. A total of 297 F7 lines were evaluated for rust resistance under greenhouse conditions using whole inoculated plants, in the laboratory using detached leaves, and under field conditions in Nigeria and Alabama (287 lines). Based on assessments from these various tests, these three lines have combinations of high levels of rust and bacterial pustule resistance, good agronomic traits, and adaptable maturity to the southern U.S. soybean breeding programs. Breeders will find the three lines useful as rust-resistant parental material in rust-prone areas.