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United States Department of Agriculture

Agricultural Research Service

Research Project: REDUCING SOYBEAN YIELD LOSSES THROUGH GENETIC IMPROVEMENT Title: Reaction of maturity group IV soybean plant introductions to Phomopsis Seed Decay in Arkansas Mississippi and Missouri 2009

Authors
item Li, Shuxian
item Rupe, John -
item Chen, Pengyin -
item Wrather, Allen -

Submitted to: Plant Disease Management Reports
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: June 18, 2010
Publication Date: August 23, 2010
Citation: Li, S., Rupe, J., Chen, P., Wrather, A. 2010. Reaction of maturity group IV soybean plant introductions to Phomopsis Seed Decay in Arkansas, Mississippi, and Missouri, 2009. Plant Disease Management Reports. 4:ST035

Interpretive Summary: Soybean Phomopsis seed decay (PSD) causes poor seed quality and suppresses yield in most of soybean-growing states in United States. In 2009, PSD caused over 12 million bushel yield loss in 16 southern states. The disease is primarily caused by a fungus (mold). To identify new sources of resistance to PSD, 45 maturity group IV soybean lines from the worldwide collection were field tested at Kibler, AR, Stoneville, MS and Portageville, MO. Some soybeans were resistant and some were susceptible to PSD across locations. PI235335 and PI416779 did not have Phomopsis spp. infection at both Mississippi and Missouri locations. PI346308 had 0% and 1% percent infection in Mississippi and Missouri, respectively. PI80837 was very susceptible to PSD in all locations. However, PI84594 had the lowest infection in Arkansas but was very susceptible in Mississippi and Missouri. Soybean lines with low infection incidences, good visual quality, and high germination rates at all locations along with selected lines having differential responses to PSD cross locations will be tested in 2010 field trials.

Technical Abstract: Soybean Phomopsis seed decay (PSD) causes poor seed quality and suppresses yield in most of soybean-growing states in United States. In 2009, PSD caused over 12 million bushel yield loss in 16 southern states. The disease is primarily caused by Phomopsis longicolla along with other Phomopsis and Diaporthe spp. Hot and humid environments, especially from pod fill through harvest, favor pathogen growth and disease development. To identify new sources of resistance to PSD, 45 maturity group IV soybean germplasm lines from 28 countries were field screened along with PSD resistant and susceptible checks in 2009 at Kibler, AR, Stoneville, MS and Portageville, MO. Planting dates for AR, MS, and MO were June 5, May 20, and May 21, respectively. The experimental design was a randomized complete block with four replications. Seeds were harvested from each plot when the plants were mature. Seeds from each plot were tested for percent of seed infected by Phomopsis spp., percent seed germination, and visual quality. Significant differences in seed infection by Phomopsis spp. were observed among soybean lines with some lines having no infection while others had levels as high as 78%. PI235335 and PI416779 did not have Phomopsis spp. infection at both Mississippi and Missouri locations. PI346308 had 0% and 1% percent infection in Mississippi and Missouri, respectively. PI80837 was very susceptible to PSD in all locations. However, PI84594 had the lowest infection in Arkansas but was very susceptible in Mississippi and Missouri. Soybean lines with low infection incidences, good visual quality, and high germination rates at all locations along with selected lines having differential responses to PSD cross locations will be tested in 2010 field trials.

Last Modified: 11/23/2014
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