Title: Applying Single Kernel Sorting Technology to Developing Scab Resistant Lines Authors
Submitted to: National Fusarium Head Blight Forum Proceedings
Publication Type: Abstract Only
Publication Acceptance Date: November 1, 2007
Publication Date: December 1, 2007
Repository URL: http://scabusa.org/pdfs/forum07_proc_complete.pdf
Citation: Dowell, F.E., Maghirang, E.B. 2007. Applying Single Kernel Sorting Technology to Developing Scab Resistant Lines. Proceedings of the 2007 National Fusarium Head Blight Forum. pg. 176. Technical Abstract: We are using automated single-kernel near-infrared (SKNIR) spectroscopy instrumentation to sort fusarium head blight (FHB) infected kernels from healthy kernels, and to sort segregating populations by hardness to enhance the development of scab resistant hard and soft wheat varieties. We sorted 3 replicates of 192 samples into a damaged fraction yielding an average of 61.3 ppm DON, and a healthy fraction yielding an average of 0.73 ppm DON. This collaborative work with Dr. Gene Milus and Peter Horevaj investigated the resistance of soft red winter wheat lines to DON and NIV chemotypes of Fusarium graminearum. In another study, we also sorted the soft portion of a hard x soft cross into FHB infected and healthy fractions, and likewise sorted the hard portion into FHB infected and healthy fractions. The hard x soft crosses were separated into the hard and soft portions in 2006 where the respective portions were inoculated and planted. The 2007 scabby and healthy fractions of the hard and soft lines will be planted this fall to determine if our sorting will result in populations with FHB resistance. This work is in cooperation with Dr. Anne McKendry and Dr. Stephen Baenziger. Another work that was done in cooperation with Dr. Stephen Wegulo, Julie Breathnach and Dr. Stephen Baenziger used the automated SKNIR system to rapidly assess lines for FHB resistance by running multiple samples and obtaining a count of infected and healthy kernels. We have done this for about 300 lines and the information is being used to select resistant lines for further testing.