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United States Department of Agriculture

Agricultural Research Service

Title: Use of Low Temperature Scanning Electron Microscopy for Identifying Invasive Mite Species.

item Ochoa, Ronald
item Erbe, Eric - USDA, SGI LAB
item Wergin, William - USDA, SGI LAB

Submitted to: Scanning
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: June 1, 2006
Publication Date: October 1, 2006
Citation: Ochoa, R., Erbe, E.E., Wergin, W.P. 2006. Lt-sem for elucidating invasive mite species. Scanning. 28(2):75-76.

Interpretive Summary: Plant-feeding mites infest nearly all crops of economic importance, including food crops, timber, and ornamental plants and cause economic losses to food and fiber destined for national and/or international markets. This paper addresses the use of low temperature scanning microscopy to better understand variation of external structures in invasive mite species. The technique allows researchers to accurately identify invasive mite species and action agencies to implement control programs in a timely manner. This study is important to taxonomists, quarantine programs, and to other personnel involved in mite systematics, integrated pest management, and control.

Technical Abstract: Low temperature scanning electron microscopy (LTSEM) has become a popular technique for studying morphology of mites. This paper addresses the use of LTSEM as a tool to better identify and understand variation in the dorsal morphology of invasive mites caused by different media preparation or mounting techniques.

Last Modified: 4/22/2015