Submitted to: International Wheat Quality Conference
Publication Type: Proceedings
Publication Acceptance Date: April 8, 2005
Publication Date: May 20, 2005
Citation: Delwiche, S. R. 2005. Up and Coming Methods and Instrumentation for End-Use Wheat Quality Measurements. In: Chung, O.K., Lookhart, G.L., editors. Standing on the Shoulders of Giants-What We Have Learned and Where We Are Going. Proceedings of Third Int'l. Wheat Quality Conference. May 22-26,2005, Manhattan Kansas, p. 283-289. Interpretive Summary: As with many other branches of the commodities and food industry, methods for wheat quality determination are continually under development that will be more rapid, easier, and ideally, more accurate, than the ones they are supposed to replace. For simplicity, rapid methods can be separated into categories, depending on the underlying properties of measurement. In the broadest sense, these are as follows: mechanical (e.g., single kernel characterization system - SKCS, rapid visco analyzer - RVA), chemical (e.g., HPLC, capillary electrophoresis, ELISA), and optical. This paper deals primarily with optical measurements, and in particular, those governed by near-infrared (NIR) and visible spectroscopy.
Technical Abstract: While numerous physical and chemical methods are available for estimating wheat end-use quality, most suffer from the lack of rapidness and have the tendency for being too complex for use in stations of commerce and online processing. In recent years, coincident with the development of inexpensive, powerful computers, several technologies have been examined to overcome these speed and complexity problems. Inarguably, the most developed of these is near-infrared (NIR) analysis, with more than 40 years of history. This paper highlights some of the recent advances in NIR and related optical technologies.