Page Banner

United States Department of Agriculture

Agricultural Research Service

Title: Marker-Assisted Selection for Nematode Resistance

Authors
item Chu, Y - UNIV OF GA
item Ozias-Akins, P - UNIV OF GA
item Holbrook, C
item Timper, Patricia

Submitted to: American Peanut Research and Education Society Abstracts
Publication Type: Abstract Only
Publication Acceptance Date: April 15, 2005
Publication Date: December 15, 2005
Citation: Chu, Y., Ozias-Akins, P., Holbrook Jr, C.C., Timper, P. 2005. Marker-assisted selection for nematode resistance [abstract]. In: Proceedings of the American Peanut Research and Education Society, July 11-15, 2005, Portsmouth, Virginia. 37:35.

Interpretive Summary: not required

Technical Abstract: The most effective nematode resistance in cultivated peanut (Arachis hypogaea L.) has been introduced from the wild diploid relative, A. cardenasii. Two nematode resistant cultivars, Coan and Nematam, have been released from the Texas breeding program. Although these cultivars have a high level of nematode resistance, they do not have resistance to tomato spotted wilt virus (TSWV) and therefore cannot be grown in the southeastern U.S. Crosses have been made with Coan or Nematam in order to introduce nematode resistance genes into lines that also have a high level of TSWV resistance. Screening for nematode resistance can be carried out by inoculation in the greenhouse, but only on a limited number of lines each winter. Screening could be accelerated by using molecular markers for selection. Published markers have been tested for their ability to track chromosomal segments carrying nematode resistance genes in our crosses. A rapid and cost-effective screening protocol has been developed and will be described. Additional AFLP markers that are present in advanced generation nematode resistant lines have been identified. Association of these markers with nematode resistance is being verified and linked markers will be converted to simpler PCR-based markers.

Last Modified: 11/28/2014
Footer Content Back to Top of Page