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United States Department of Agriculture

Agricultural Research Service

Title: Trap Markers for Disease Resistance in Common Bean

Authors
item Miklas, Phillip
item Hu, Jinguo
item Grunwald, Niklaus
item Bosak, Karen - WSU-IAREC,PROSSER,WA

Submitted to: American Society of Agronomy Abstracts
Publication Type: Abstract Only
Publication Acceptance Date: June 6, 2004
Publication Date: November 1, 2004
Citation: Miklas, P.N., Hu, J., Grunwald, N.J., Bosak, K. 2004. Trap markers for disease resistance in common bean. American Society of Agronomy Abstracts. Madison, WI. No. 3496.

Technical Abstract: The TRAP (Target Region Amplified Polymorphism) technique is a simple but powerful PCR-based system useful for generating polymorphic markers around targeted candidate gene sequences. TRAPs for disease resistance genes in common bean were targeted in this study. Two mapping population were used to generate and map TRAP markers. The RIL (recombinant inbred line) mapping population BAT 93/Jalo EEP 558 (BJ) was obtained from P. Gepts (University of California-Davis). The Dorado/XAN 176 RIL (DX) population was obtained from J. Beaver (Univ. of Puerto Rico-Mayaguez) and has been used previously to map loci conditioning resistance to diseases caused by bacterial, fungal, and viral pathogens in common bean. For the 21 TRAPs obtained in the DX population, eight were unlinked, four incorporated into existing linkage groups, and nine formed three linkage groups of 2, 3, and 4 TRAPs. Three of the partial linkage groups consisting of just TRAP markers and two of the unlinked TRAP markers detected new QTL. For the BJ population, 88 of the 107 TRAPs mapped to the eleven linkage groups, ranging from 3 to 12 per linkage group. The TRAPs tended to cluster and some mapped in the vicinity of resistance gene loci and clusters on linkage group B4. These data suggest that TRAPs will be useful for tagging and mapping disease resistance traits in common bean.

Last Modified: 10/21/2014