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United States Department of Agriculture

Agricultural Research Service

Title: Evaluation of Langdon Durum-Aegilops Tauschii Synthetic Hexaploid Wheats for Their Seedling Reaction to Tan Spot, Stagonaspora Leaf Blotch, Leaf Rust, Stem Rust, and Hessian Fly

Authors
item Friesen, Timothy
item Xu, Steven
item Faris, Justin
item Rasmussen, Jack - PLNT PATH NDSU, FARGO, ND
item Miller, James - RETIRED ARS
item Harris, Marion - ENTOMOLOGY, NDSU FARGO ND

Submitted to: Wheat Genetics International Symposium Proceedings
Publication Type: Abstract Only
Publication Acceptance Date: June 20, 2003
Publication Date: N/A

Technical Abstract: Langdon durum-Aegilops tauschii synthetic hexaploid wheats (SHW) (AABBDD) developed by L.R. Joppa in 1980s were evaluated for seedling resistance to multiple diseases and Hessian fly. Langdon was moderately susceptible to tan spot, susceptible to Stagonospora leaf blotch, resistant to stem rust and leaf rust and susceptible to Hessian fly. The SHWs showed average tan spot and Stagonospora leaf blotch reactions ranging from 1.33 to 4.17 and 1.67 to 4.67 (1-5 scale), respectively. The SHW lines, like Langdon, gave resistant to moderately resistant reactions to all races tested for stem rust. Even though Langdon gave a resistant response to all races tested for leaf rust, some SHW lines showed moderately susceptible reactions to some isolates. Hessian fly inoculations showed three SHWs to be highly resistant to the Great Plains biotype. These results indicate that some Ae. tauschii accessions are contributing resistance against Stagonospora leaf blotch, tan spot and Hessian Fly whereas, it was impossible to identify Ae. tauschii stem rust or leaf rust resistance found in the SHW lines because of resistance present in the durum parent. These SHW lines should prove useful for incorporation into breeding programs for crop improvement.

Last Modified: 8/21/2014
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