ARS | Publication request: MARKER ASSISTED SELECTION FOR ENHANCED DISEASE RESISTANCE IN COMMON BEAN

Submitted to: Durable Disease Resistance Symposium
Publication Type: Proceedings
Publication Acceptance Date: August 1, 2000
Publication Date: December 1, 2000
Citation: MIKLAS, P.N., KELLY, J.D. MARKER ASSISTED SELECTION FOR ENHANCED DISEASE RESISTANCE IN COMMON BEAN. DURABLE DISEASE RESISTANCE SYMPOSIUM, Vol. 2, p. 17. 2000.

Technical Abstract: The combining of resistance genes in common bean (Phaseolus vulgaris) may be desired to: i) acquire a higher level of resistance against a particular pathotype (isolate, strain, race); ii) obtain resistance against a broader range of pathotypes; iii) retain defeated resistance genes; and iv) combine different mechanisms of resistance. There are 19 sequence characterized amplified region (SCAR) markers available for indirect selection of 10 qualitatively and 5 quantitatively expressed genes conditioning resistance to bacterial, fungal, and viral bean diseases. SCAR markers have been used to combine quantitative trait loci (QTL) for a higher level of resistance to common bacterial blight (caused by Xanthomonas campestris pv. phaseoli), pyramid dominant and recessive genes for a more durable resistance to bean common mosaic virus, detect the combination of a recessive gene and QTL providing greater resistance to bean golden mosaic virus (BGMV), and ascertain the retention of defeated genes providing for resistance to new rust (caused by Uromyces appendiculatus pv. phaseoli) races. In addition, a SCAR marker is being used to backcross a resistance gene effective against most known races of the anthracnose pathogen (Colletotrichum lindemuthianum) into dry and snap beans. The utility and development of marker-assisted selection will be detailed from results obtained in our laboratory and the literature.