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United States Department of Agriculture

Agricultural Research Service

Title: Multiplex Scar Selection for Combined Resistance to Common Bacterial Blight in Dry Bean

Authors
item Miklas, Phillip
item Smith, James
item Delorme, Richard
item Grafton, K - N. DAKOTA STATE UNIV
item Singh, S - UNIV. OF IDAHO

Submitted to: American Society of Agronomy
Publication Type: Abstract Only
Publication Acceptance Date: March 1, 1999
Publication Date: October 1, 1999
Citation: MIKLAS, P.N., SMITH, J.R., DELORME, R.M., GRAFTON, K.F., SINGH, S.P. MULTIPLEX SCAR SELECTION FOR COMBINED RESISTANCE TO COMMON BACTERIAL BLIGHT IN DRY BEAN. AMERICAN SOCIETY OF AGRONOMY. 1999.

Technical Abstract: Common bacterial blight (CBB) caused by Xanthomonas campestris pv. phaseoli is a widespread, seed-transmitted, major disease of dry bean (Phaseolus vulgaris L.). Breeding for high levels of resistance is complicated by poor adaptation of resistant germplasm and low heritability. The tropical sources, XAN 159 and XAN 176, contribute three independent QTL for rCBB resistance. Our objective was to investigate the effectiveness of marker-assisted selection for combined resistance in segregating F2 populations using SCAR markers linked with the three QTL. Results indicated that marker-assisted breeding for combined resistance to CBB in temperately-adapted dry bean was possible. Moreover, simultaneous select- tion for certain QTL combinations was possible using multiplex PCR.

Last Modified: 11/26/2014
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