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ARS Home » Plains Area » Manhattan, Kansas » Center for Grain and Animal Health Research » Hard Winter Wheat Genetics Research » Research » Publications at this Location » Publication #315075
Title: Single nucleotide polymorphism markers linked to QTL for wheat yield traits

Author
item LI, CHUNLIAN - Kansas State University
item Bai, Guihua
item CARVER, BRETT - Oklahoma State University
item Chao, Shiaoman
item WANG, ZHONGHUA - Northwest Agriculture And Forestry University

Submitted to: Euphytica
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 5/1/2015
Publication Date: 5/30/2015
Citation: Li, C., Bai, G., Carver, B., Chao, S., Wang, Z. 2015. Single nucleotide polymorphism markers linked to QTL for wheat yield traits. Euphytica. Published online 30 May 2015. DOI: 10.1007/s10681-015-1475-3.

Interpretive Summary: Continuous improvement in grain yield is one of the major challenges for wheat breeding. We developed a high-density genetic map of single nucleotide polymorphism (SNP) and simple sequence repeat (SSR) markers using a recombinant inbred line (RIL) population derived from cultivars ‘Ning7840’ x ‘Clark’. The map was used to locate quantitative trait loci (QTL) for wheat grain yield and its components. A total of 29 additive QTLs were mapped on 13 chromosomes based on phenotypic data for grain yield (GY), spike number per square meter (SNPM), kernel number per spike (KNPS), and thousand-kernel weight (TKW) from three Oklahoma locations. Eight QTLs were detected for GY, two for SNPM, five for KNPS, and 14 for TKW. QTLs that were repeatable in multiple environments were identified for all traits except SNPM. Positive alleles were dispersed between the two parents for all traits, with ‘Clark’ contributing slightly more positive alleles. This information can be used by plant breeders to improve wheat yields and thousand-kernel weight.

Technical Abstract: Continuous improvement in grain yield is one of the major challenges for wheat (Triticum aestivum L.) breeding worldwide. This study characterized quantitative trait loci (QTL) underlying wheat grain yield and its components using a high-density genetic linkage map developed from a recombinant inbred line (RIL) population derived from ‘Ning7840’ x ‘Clark’. The map consisted of 594 single nucleotide polymorphism (SNP) and 404 simple sequence repeat (SSR) markers covering a genetic distance of 4225.7 cM. The RIL population was evaluated for grain yield (GY), spike number per m2 (SNPM), kernel number per spike (KNPS), and thousand-kernel weight (TKW) in three Oklahoma locations from 2001 to 2003. A total of 29 additive QTL (eight for GY, two for SNPM, five for KNPS, and 14 for TKW) were mapped on 13 chromosomes. Eight pairs of epistatic QTL were detected for different yield components: four for GY, two for KNPS, and two for TKW. Four additive QTL, including two for GY and two for KNPS, showed additive x environmental (AE) interactions. QTL that were repeatable in multiple environments were identified for all traits except SNPM. Positive alleles were dispersed between two parents for all traits, with ‘Clark’ contributing slightly more positive alleles. Seven pleiotropic loci were co-localized for at least two traits. Interestingly, all co-localized loci overlapped for TKW, and four of them overlapped for GY. Thus, selecting QTL for TKW may spontaneously select for or against yield or other yield components in breeding.