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ARS Home » Plains Area » Manhattan, Kansas » Center for Grain and Animal Health Research » Hard Winter Wheat Genetics Research » Research » Publications at this Location » Publication #323099
Title: Single nucleotide polymorphisms linked to quantitative trait loci for grain quality traits in wheat

Author
item LI, CHUNLIAN - Kansas State University
item Bai, Guihua
item CARVER, BRETT - Oklahoma State University
item Chao, Shiaoman
item WANG, ZHONGHUA - Northwest Agricultural & Forestry University

Submitted to: The Crop Journal
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 11/27/2015
Publication Date: 12/4/2015
Publication URL: https://handle.nal.usda.gov/10113/63227
Citation: Li, C., Bai, G., Carver, B., Chao, S., Wang, Z. 2015. Single nucleotide polymorphisms linked to quantitative trait loci for grain quality traits in wheat. The Crop Journal. (2016) 4: 1-11.

Interpretive Summary: Wheat grain quality traits define the value and potential end-use products of a wheat cultivar. A study was conducted to genetically map the genes controlling grain quality in a population derived from the cross of wheat cultivars ‘Ning7840’ and ‘Clark’. The population was evaluated for quality traits in seven Oklahoma environments from 2001 to 2003. A total of 41 genes with additive effects on different quality traits were identified on most wheat chromosomes except for 1A, 2A, 3D, 4D, 6D and 7B. The findings shed light on the inheritance of wheat grain quality traits and provide DNA markers for manipulating these important traits to improve quality of new wheat cultivars.

Technical Abstract: Wheat (Triticum aestivum L.) grain quality traits that are controlled by quantitative traits loci (QTLs) define suitable growing areas and potential end-use products of a wheat cultivar. To dissect the QTLs for these traits including protein content (GPC), test weight (TW), single kernel characterization system (SKCS) estimated kernel weight (SKW), kernel diameter (KD), and kernel hardness as measured by near-infrared reflectance spectroscopy (NIRS) hardness index (NHI) and SKCS-hardness index (SHI), a high-density genetic map with single nucleotide polymorphism (SNP) and simple sequence repeat (SSR) markers was developed using recombinant inbred lines (RILs) derived from ‘Ning7840’ x ‘Clark’. The RILs were evaluated for these quality traits in seven Oklahoma environments from 2001 to 2003. A total of 41 QTLs with additive effects on different traits were mapped on most wheat chromosomes except for 1A, 2A, 3D, 4D, 6D and 7B. Seven chromosome regions showed either tightly linked QTLs or QTLs with pleiotropic effects on two to four traits. Ten pairs of QTLs showed additive x additive effects (AA), four QTLs were involved in additive x environment (AE) effects, and one was involved in AAE effects. Two to eleven QTLs for each of the six traits and 139 tightly linked markers to these QTLs were identified. The findings shed light on the inheritance of wheat grain quality traits and provide DNA markers for manipulating these important traits to improve quality of new wheat cultivars.