Technical Abstract: The current US corn grading system accounts for the portion of damaged kernels, which is measured by time-consuming and inaccurate visual inspection. Near infrared spectroscopy (NIRS), a non-destructive and fast analytical method, was tested as a tool for discriminating corn kernels with heat and frost damage. Four classification algorithms were utilized: Partial least squares discriminant analysis (PLS-DA), soft independent modeling of class analogy (SIMCA), k-nearest neighbors (K-NN), and least-squares support vector machines (LS-SVM). The feasibility of NIRS for discriminating normal or viable-germinating corn kernels and soybean seeds from abnormal or dead seeds was also tested. This application could be highly valuable for seed breeders and germplasm-preservation managers because current viability tests are based on a destructive method where the seed is germinated.