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ARS Home » Plains Area » Fargo, North Dakota » Edward T. Schafer Agricultural Research Center » Cereal Crops Research » Research » Publications at this Location » Publication #203502
Title: Stem rust, tan spot, Stagonospora nodorum blotch, and Hessian fly resistance in Langdon durum - Aegilops tauschii synethetic hexaploid wheat lines.

Author
item Friesen, Timothy
item Xu, Steven
item HARRIS, MARION - NORTH DAKOTA STATE UNIVER

Submitted to: Crop Science
Publication Type: Peer Reviewed Journal
Publication Acceptance Date: 10/31/2007
Publication Date: 11/13/2007
Citation: Friesen, T.L., Xu, S.S., Harris, M.O. 2007. Stem rust, tan spot, Stagonospora nodorum blotch, and Hessian fly resistance in Langdon durum - Aegilops tauschii synethetic hexaploid wheat lines.. Crop Science. 48:1062-1070

Interpretive Summary: Diseases and pests of wheat produce severe losses to growers each year. In this study, we evaluated several synthetic wheat lines for their reaction to the pathogens causing stem rust, tan spot, and Stagonospora nodorum blotch, as well as for resistance to Hessian fly. Several synthetic wheat lines were identified containing good levels of resistance to each disease and pest as well as a few lines showing good levels of resistance to all pathogens and pests tested. These lines will be used to further characterize these alternate sources of resistance followed by the introgression of the resistance into bread wheat (hexaploid wheat).

Technical Abstract: Diseases and pests of wheat incur serious yield and quality losses to wheat grown worldwide. In the current study, we tested synthetic hexaploid wheat (SHW) lines developed from various Aegilops tauschii lines crossed with the tetraploid durum wheat line Langdon. The SHW lines were tested along with their durum wheat and Ae. tauchii parents for resistance to Puccinia graminis f. sp. tritici (stem rust), Pyrenophora tritici-repentis (tan spot) and Stagonospora nodorum (Stagonospora nodorum blotch) as well as for resistance to Hessian fly. Langdon durum and all SHW lines were resistant to all races tested for stem rust and although the durum parent (Langdon) was susceptible to tan spot, Stagonospora nodorum blotch and Hessian fly, good levels of resistance were identified in several synthetic lines for each disease or pest indicating that the Ae. tauchii lines used in constructing the SHW lines could be new sources of resistance. The resistance present in the SHW lines is presently being characterized for eventual introgression into hexaploid bread wheat.