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Research Project:
DEVELOP HIGH-THROUGHPUT MARKERS FOR GENETIC IMPROVEMENT OF WHEAT FOR MULTIPLE TRAITS
Location: Hard Winter Wheat Genetics Research Unit
Project Number: 5430-21000-006-40
Project Type:
Specific Cooperative Agreement
Start Date: Sep 01, 2012
End Date: Aug 30, 2017
Objective:
Develop and implement next generation molecular marker technology in wheat breeding.
Approach:
Mapping populations will be analyzed using the 90K wheat SNP chip and SSR markers and detailed SNP/SSR maps will be constructed and used for mapping of important loci controlling disease resistance, abiotic stress tolerance, grain quality, etc. Low-throughput markers reported for different genes will be converted into a set of high throughput SNP markers by LD analysis of 90K SNP chip. Developed SNPs will be assembled into sets of 30-35 SNP markers to be analyzed in Sequenom MassArray and validated using different mapping populations. Those marker sets will be used for selection of multiple traits in breeding programs.
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Last Modified: 05/21/2013
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