Location: Hard Winter Wheat Genetics Research Unit
2012 Annual Report
High temperature has been a major constraint for wheat production in the Great Plains region, and will become a more important factor due to global warming. Identifying heat tolerant lines through large scale screening of germplasm lines in precisely controlled growth chambers is the key to develop heat tolerant varieties. During the past year, we tested two association mapping panels for heat tolerance. One is a panel of 160 Asian spring wheat lines and the other is a panel of 304 winter wheat lines. Accessions were subjected to heat stress for three weeks. Lines with heat tolerance were identified based on grain yield and the “stay-green” trait whereby chlorophyll content remains high under heat stress treatments. Eight tolerant lines and 3 very susceptible lines based on the stay-green trait have been selected. They are currently being grown at high temperatures in growth chambers to confirm the results. Tolerant and intolerant lines will be intercrossed to develop new mapping populations to identify the genes that control heat tolerance in these lines. Genotyping data is being collected so that these two panels can be subjected to association analysis to identify additional genes that control heat tolerance.