IDENTIFICATION AND MAPPING OF DISEASE RESISTANCE GENES IN WHEAT
Cereal Crops Research
2010 Annual Report
1a.Objectives (from AD-416)
The objectives of this cooperative research project are: .
1)identify tan spot and Stagonospora nodorum blotch resistance genes in wheat,.
2)determine the chromosomal locations of the resistance genes, and.
3)identify or develop markers suitable for marker-assisted selection of the resistance genes.
1b.Approach (from AD-416)
A recombinant inbred (RI) population derived from a cross between the resistant wheat landrace Salamouni and the susceptible Canadian variety Katepwa will be developed for the identification and mapping of novel resistance genes. The RI population will be genotyped with molecular markers, and linkage maps representing all 21 wheat chromosomes will be assembled. The population of RI lines will be screened for reaction to multiple races of the tan spot fungus and isolates of S. nodorum. The phenotypic data will be regressed on the molecular marker data to identify quantitative trait loci (QTL) associated with resistance. Genomic regions harboring significant QTL will be targeted for saturation mapping to identify and/or develop user-friendly PCR-based markers tightly linked to the QTL for marker-assisted selection.
Wheat bin-mapped EST libraries and corresponding sequences were obtained and will be used for primer design and the development of markers targeting genomic regions harboring resistance loci once QTLs are identified in the Salamouni x Katepwa mapping population. Also, microsatellite primer sequences were obtained from the Graingenes database and from colleagues at Japan for use in the development of genetic linkage maps.
ADODR monitoring activities to evaluate research progress included regular discussions between ARS and NDSU collaborators.