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United States Department of Agriculture

Agricultural Research Service

Image Number D3155-1

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 Image Number D3155-1

Using a fluorescence microscope, plant pathologist Shuxian Li observes the pathogen Phomopsis longicolla that causes Phomopsis seed decay of soybean.


Photo by Crop Genetic Research Unit.

640 pixels wide: (d3155-1.jpg)

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Last Modified: 4/17/2014
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